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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

271,02 
271,02 
2025-07-31 271.0200 InStock
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Knygos aprašymas

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Informacija

Autorius: Manoj Sachdev, Andrei Pavlov,
Serija: Frontiers in Electronic Testing
Leidėjas: Springer Netherlands
Išleidimo metai: 2010
Knygos puslapių skaičius: 212
ISBN-10: 904817855X
ISBN-13: 9789048178551
Formatas: Knyga minkštu viršeliu
Kalba: Anglų
Žanras: Electronics: circuits and components

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