Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
| Serija: | Springer Series in Surface Sciences |
| Leidėjas: | Springer Berlin Heidelberg |
| Išleidimo metai: | 2016 |
| Knygos puslapių skaičius: | 388 |
| ISBN-10: | 3662510200 |
| ISBN-13: | 9783662510209 |
| Formatas: | Knyga minkštu viršeliu |
| Kalba: | Anglų |
| Žanras: | Condensed matter physics (liquid state and solid state physics) |
Parašykite atsiliepimą apie „Ellipsometry of Functional Organic Surfaces and Films“
