This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
| Autorius: | Otwin Breitenstein, Martin C. Schubert, Wilhelm Warta, |
| Serija: | Springer Series in Advanced Microelectronics |
| Leidėjas: | Springer Nature Switzerland |
| Išleidimo metai: | 2019 |
| Knygos puslapių skaičius: | 344 |
| ISBN-10: | 3319998242 |
| ISBN-13: | 9783319998244 |
| Formatas: | Knyga kietu viršeliu |
| Kalba: | Anglų |
| Žanras: | Laser physics |
Parašykite atsiliepimą apie „Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials“
