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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact

287,96 
287,96 
2025-07-31 287.9600 InStock
Nemokamas pristatymas į paštomatus per 18-22 darbo dienų užsakymams nuo 19,00 

Knygos aprašymas

This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices¿ performance. Several control and possible gettering approaches are addressed.
The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

Informacija

Autorius: Eddy Simoen, Cor Claeys,
Serija: Springer Series in Materials Science
Leidėjas: Springer Nature Switzerland
Išleidimo metai: 2018
Knygos puslapių skaičius: 472
ISBN-10: 3319939246
ISBN-13: 9783319939247
Formatas: Knyga kietu viršeliu
Kalba: Anglų
Žanras: Engineering applications of electronic, magnetic, optical materials

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