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Reliability Issues and Approaches in MOSFET circuits

57,42 
57,42 
2025-07-31 57.4200 InStock
Nemokamas pristatymas į paštomatus per 16-20 darbo dienų užsakymams nuo 19,00 

Knygos aprašymas

This is the first publication by me on Reliability issues of nano scale devices. As the technology is shrinking the Reliability issues increase exponentially. In this work i had evaluated the life time of a device if under the different condition. Worked on different latest devices like Silicon on Insulator(SOI) and LD MOS. We had proposed different techniques to enhance or increase the life span of devices. Because they impact the operation of different crucial application like automobile, space.

Informacija

Autorius: Amit Kumar
Leidėjas: LAP LAMBERT Academic Publishing
Išleidimo metai: 2019
Knygos puslapių skaičius: 72
ISBN-10: 6200325782
ISBN-13: 9786200325785
Formatas: Knyga minkštu viršeliu
Kalba: Anglų
Žanras: Electronics and communications engineering

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