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RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

66,20 
66,20 
2025-07-31 66.2000 InStock
Nemokamas pristatymas į paštomatus per 16-20 darbo dienų užsakymams nuo 19,00 

Knygos aprašymas

Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.

Informacija

Autorius: Daniel Müller
Leidėjas: Karlsruher Institut für Technologie
Išleidimo metai: 2018
Knygos puslapių skaičius: 214
ISBN-10: 3731508222
ISBN-13: 9783731508229
Formatas: Knyga minkštu viršeliu
Kalba: Anglų
Žanras: Electrical engineering

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