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Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

254,08 
254,08 
2025-07-31 254.0800 InStock
Nemokamas pristatymas į paštomatus per 16-20 darbo dienų užsakymams nuo 19,00 

Knygos aprašymas

This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.

Informacija

Autorius: Xiong Du, Jun Zhang, Rui Du, Yaoyi Yu, Cheng Qian, Gaoxian Li,
Serija: CPSS Power Electronics Series
Leidėjas: Springer Nature Singapore
Išleidimo metai: 2023
Knygos puslapių skaičius: 188
ISBN-10: 9811931348
ISBN-13: 9789811931345
Formatas: Knyga minkštu viršeliu
Kalba: Anglų
Žanras: Electronics: circuits and components

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